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Transactions of the Institute of Measurement and Control
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Contents: June 1 2000, Volume 22, No. 2   [Index by Author]       Other Issues: Previous issue Next issue  

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To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.

David Williams

Transactions of the Institute of Measurement and Control 2000 22: 123-124. [PDF] [References]  

Ben McKay, Mark J. Willis, Dominic P. Searson, and Gary A. Montague

Transactions of the Institute of Measurement and Control 2000 22: 125-140. [Abstract] [PDF] [References]  

Euan W. McGookin, David J. Murray-Smith, Yun Li, and Thor I. Fossen

Transactions of the Institute of Measurement and Control 2000 22: 141-178. [Abstract] [PDF] [References]  

K. P. Dahal, J. R. McDonald, and G. M. Burt

Transactions of the Institute of Measurement and Control 2000 22: 179-194. [Abstract] [PDF] [References]  

K. J. Shaw and P. J. Fleming

Transactions of the Institute of Measurement and Control 2000 22: 195-210. [Abstract] [PDF] [References]  

To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.