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Transactions of the Institute of Measurement and Control
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Contents: December 1 2000, Volume 22, No. 5   [Index by Author]       Other Issues: Previous issue Next issue  

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To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.

K. T.V. Grattan

Transactions of the Institute of Measurement and Control 2000 22: 353-354. [PDF]  

J. E. Walsh, K. Y. Kavanagh, S. Fennell, J. Murphy, and M. Harmey

Transactions of the Institute of Measurement and Control 2000 22: 355-369. [Abstract] [PDF] [References]  

Y. Huang and Y. Yan

Transactions of the Institute of Measurement and Control 2000 22: 371-384. [Abstract] [PDF] [References]  

W. B. Lyons and E. Lewis

Transactions of the Institute of Measurement and Control 2000 22: 385-404. [Abstract] [PDF] [References]  

C. H. Wang, A. T. Augousti, and J. Mason

Transactions of the Institute of Measurement and Control 2000 22: 405-412. [Abstract] [PDF] [References]  

F. H. Zhang, E. Lewis, and P. J. Scully

Transactions of the Institute of Measurement and Control 2000 22: 413-430. [Abstract] [PDF] [References]  

Rebecca J. Bartlett, Rekha Philip-Chandy, Piers Eldridge, David F. Merchant, Roger Morgan, and Patricia J. Scully

Transactions of the Institute of Measurement and Control 2000 22: 431-457. [Abstract] [PDF] [References]  

To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.