Transactions of the Institute of Measurement and Control -- Index by Author (Dec 2007; Volume 29, Number 5)

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Index by Author: Dec 2007; 29 (5) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

B: Barnes, S.E. [Abstract] [PDF] [References]; Benali, S. [Abstract] [PDF] [References]; Bendada, A. [Abstract] [PDF] [References]; Bertrand, D. [Abstract] [PDF] [References]; Brown, E.C. [Abstract] [PDF] [References]; Brown, Elaine C. [PDF]; Bur, Anthony J. [Abstract] [PDF] [References]
C: Cheng, C.-C. [Abstract] [PDF] [References]; Coates, P.D. [Abstract] [PDF] [References]; Coates, P.D. [Abstract] [PDF] [References]
D: Derdouri, A. [Abstract] [PDF] [References]; Dupuy, J. [Abstract] [PDF] [References]
E: Edwards, H.G.M. [Abstract] [PDF] [References]
J: Jen, C.-K. [Abstract] [PDF] [References]
K: Kobayashi, M. [Abstract] [PDF] [References]
L: Lachenal, G. [Abstract] [PDF] [References]; Lamontagne, M. [Abstract] [PDF] [References]; Lee, Yu-Hsin [Abstract] [PDF] [References]
M: Maazouz, A. [Abstract] [PDF] [References]; Maupin, Paul H. [Abstract] [PDF] [References]; McAfee, M. [Abstract] [PDF] [References]
O: Ono, Y. [Abstract] [PDF] [References]
R: Roth, Steven C. [Abstract] [PDF] [References]
S: Sibley, M.G. [Abstract] [PDF] [References]; Simard, Y. [Abstract] [PDF] [References]; Start, Paul R. [Abstract] [PDF] [References]
W: Whiteside, B.R. [Abstract] [PDF] [References]

B