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Transactions of the Institute of Measurement and Control

Index by Author: Jun 2009; 31 (3-4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z


BBack

Ballal, P. [Abstract] [PDF] [References]


CBack

Cho, Jae-Sung [Abstract] [PDF] [References]
Christophersen, Jon [Abstract] [PDF] [References]


GBack

Goebel, K.F. [Abstract] [PDF] [References]
Goebel, Kai [Abstract] [PDF] [References]


HBack

Haiying Huang, [Abstract] [PDF] [References]


JBack

Jie Gu, [Abstract] [PDF] [References]


LBack

Lewis, F. [Abstract] [PDF] [References]
Li, J.C. [Abstract] [PDF] [References]


MBack

Majumdar, Ayan [Abstract] [PDF] [References]
Mylaraswamy, Dinkar [Abstract] [PDF] [References]


NBack

Nwadiogbu, Emmanuel [Abstract] [PDF] [References]


OBack

Olson, Lewis [Abstract] [PDF] [References]
Orchard, Marcos E. [Abstract] [PDF] [References]


PBack

Pecht, Michael [Abstract] [PDF] [References]


SBack

Saha, Bhaskar [Abstract] [PDF] [References]
Subbarao, Kamesh [Abstract] [PDF] [References]


VBack

Vachtsevanos, George J. [Abstract] [PDF] [References]
Vemuri, Arun T. [Abstract] [PDF] [References]


YBack

Yan, W.Z. [Abstract] [PDF] [References]